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IEC 63003:2015 ED1

Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505™ IEC 63003:2015 ED1

Publication date:   Dec 14, 2015

General information

60.60 Standard published   Dec 14, 2015

IEEE

TC 91

International Standard

25.040.01   Industrial automation systems in general

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Scope

IEC 63003:2015(E) the scope is the definition of a pin map utilizing the IEEE 1505 receiver fixture interface (RFI). The pin map defined within this standard shall apply to military and aerospace automatic test equipment (ATE) testing applications.

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PUBLISHED
IEC 63003:2015 ED1
60.60 Standard published
Dec 14, 2015