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IEC 62899-503-1:2020 ED1

Printed electronics - Part 503-1: Quality assessment - Test method of displacement current measurement for printed thin-film transistor IEC 62899-503-1:2020 ED1

Publication date:   May 27, 2020

General information

60.60 Standard published   May 27, 2020

IEC

TC 119

International Standard

29.045   Semiconducting materials | 31.080.30   Transistors

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Scope

IEC 62899-503-1:2020(E) specifies a test method for displacement current measurement (DCM) for printed thin film transistors (TFTs) or organic thin film transistors (OTFTs).

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PUBLISHED
IEC 62899-503-1:2020 ED1
60.60 Standard published
May 27, 2020