IEC 62899-203:2024 defines terms and specifies standard methods for characterization and evaluation of semiconductor inks and semiconductive layers that are made from semiconductor inks. This edition includes the following significant technical changes with respect to the previous edition:
a) addition of 6.3.1.2.2 - Normalised on-current measurement of the TFT device;
b) in 6.3.2, correction of formula for calculation of permittivity.
WITHDRAWN
IEC 62899-203:2018 ED1
PUBLISHED
IEC 62899-203:2024 ED2
60.60
Standard published
May 28, 2024