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IEC 62528:2007 ED1

Standard Testability Method for Embedded Core-based Integrated Circuits IEC 62528:2007 ED1

Publication date:   Nov 7, 2007

General information

60.60 Standard published   Nov 7, 2007

IEEE

TC 91

International Standard

31.200   Integrated circuits. Microelectronics

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Scope

Defines a mechanism for the test of core designs within a system on chip (SoC).This mechanism constitutes a hardware architecture and leverages the core test language (CTL)to faciliate communication between core designers and core integrators.

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PUBLISHED
IEC 62528:2007 ED1
60.60 Standard published
Nov 7, 2007