IEC 62526:2007 ED1

Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments IEC 62526:2007 ED1

Publication date:   Nov 7, 2007

Scope

Provides an interface between digital test generation tools and test equipment. A test description language is defined that:(a) facilitates the transfer of digital test vector data from CAE to ATE environments;(b) specifies patten, format, and timing information sufficant to define the application of digital test vectors to a DUT;and (c) supports the volume of test vector data generated from structured tests.