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IEC 62433-2:2017 ED2

EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE) IEC 62433-2:2017 ED2

Publication date:   Jan 27, 2017

General information

60.60   Standard published   Jan 27, 2017

IEC

TC 47/SC 47A

International Standard

31.200   Integrated circuits. Microelectronics | 33.100.10   Emission

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Scope

IEC 62433-2:2017 specifies macro-models for an Integrated Circuit (IC) to simulate conducted electromagnetic emissions on a printed circuit board. The model is commonly called Integrated Circuit Emission Model - Conducted Emission (ICEM-CE). The ICEM-CE macro-model can also be used for modelling an IC-die, a functional block and an Intellectual Property (IP) block. The ICEM-CE macro-model can be used to model both digital and analogue ICs. This edition includes the following significant technical changes with respect to the previous edition:
Incorporation of an XML based exchange format for model representation.

Life cycle

PREVIOUSLY

WITHDRAWN
IEC 62433-2:2008 ED1

NOW

PUBLISHED
IEC 62433-2:2017 ED2
60.60 Standard published
Jan 27, 2017




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