Menu

0

IEC 62416:2010 ED1

Semiconductor devices - Hot carrier test on MOS transistors

Publication date:   Apr 26, 2010

General information

60.60 Standard published   Apr 26, 2010

IEC

TC 47

International Standard

31.080.30   Transistors

Buying

  Published

PDF - €48.40

  English   French  



Buy

Scope

IEC 62416:2010 describes the wafer level hot carrier test on NMOS and PMOS transistors. The test is intended to determine whether the single transistors in a certain (C)MOS process meet the required hot carrier lifetime.

Life cycle

NOW

PUBLISHED
IEC 62416:2010 ED1
60.60 Standard published
Apr 26, 2010