IEC 62373:2006 ED1
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) IEC 62373:2006 ED1
Publication date:
Jul 18, 2006
General information
60.60
Standard published
Jul 18, 2006
IEC
TC 47
International Standard
31.080.30
Transistors
Scope
Provides a test procedure for a bias-temperature (BT) stability test of metal-oxide semiconductor, field-effect transistors (MOSFET)
Life cycle
NOW
PUBLISHED
IEC 62373:2006 ED1
60.60
Standard published
Jul 18, 2006