IEC 62153-4-7:2015 describes a triaxial method, suitable to determine the surface transfer impedance and/or screening attenuation and coupling attenuation of mated screened connectors (including the connection between cable and connector) and cable assemblies. This method could also be extended to determine the transfer impedance, coupling or screening attenuation of balanced or multipin connectors and multicore cable assemblies. For the measurement of transfer impedance and screening- or coupling attenuation, only one test set-up is needed. This edition includes the following significant technical changes with respect to the previous edition:
The document is revised and updated. The changes of the revised IEC 62153-4-3:2013, and IEC 62153-4-4:2015, are included. Measurements can be achieved now with mismatch at the generator site, impedance matching devices are not necessary. The contents of the corrigendum of April 2016 have been included in this copy.
WITHDRAWN
IEC 62153-4-7:2006 ED1
WITHDRAWN
IEC 62153-4-7:2015 ED2
99.60
Withdrawal effective
Jul 23, 2021
WITHDRAWN
IEC 62153-4-7:2015/COR1:2016 ED2
WITHDRAWN
IEC 62153-4-7:2015/AMD1:2018 ED2
PUBLISHED
IEC 62153-4-7:2021 ED3