60.60 Standard published Oct 10, 2005
IEC
International Standard
31.200 Integrated circuits. Microelectronics
This measurement procedure describes a measurement method to quantify the RF immunity of integrated circuits (ICs) mounted on a standardized test board or on their final application board (PCB), to electromagnetic conductive disturbances.
PUBLISHED
IEC 62132-5:2005 ED1
60.60
Standard published
Oct 10, 2005