95.99 Withdrawal of Standard Dec 6, 2024
IEC
International Standard
31.200 Integrated circuits. Microelectronics
Withdrawn
This measurement procedure describes a measurement method to quantify the RF immunity of integrated circuits (ICs) mounted on a standardized test board or on their final application board (PCB), to electromagnetic conductive disturbances.
WITHDRAWN
IEC 62132-5:2005 ED1
95.99
Withdrawal of Standard
Dec 6, 2024