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IEC 62047-65 ED1

Semiconductor devices - Micro-electromechanical devices - Part 65: Test methods for electrical stimulation environment and Electrophysiological measurement using 3D Cell-tissues Models with MEMS chips

General information

20.99   WD approved for registration as CD   Jul 24, 2026

CD    Dec 25, 2026

IEC

TC 47/SC 47F

International Standard

31.080.99   Other semiconductor devices

Life cycle

NOW

IN_DEVELOPMENT
IEC 62047-65 ED1
20.99 WD approved for registration as CD
Jul 24, 2026