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IEC 62047-62 ED1

Semiconductor devices - Micro-electromechanical systems - Part 62: Electrical resistance test method for hybrid MEMS materials under combined tensile and torsional deformation IEC 62047-62 ED1

General information

30.99   CD approved for registration as DIS   Sep 4, 2026

TCDV    Feb 26, 2027

IEC

TC 47/SC 47F

International Standard

31.080.99   Other semiconductor devices

Life cycle

NOW

IN_DEVELOPMENT
IEC 62047-62 ED1
30.99 CD approved for registration as DIS
Sep 4, 2026




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