IEC 62047-56 ED1

Semiconductor devices - Micro-electromechanical devices - Part 56: Test method for characteristics of MEMS metal oxide semiconductor (MOS) type gas sensor IEC 62047-56 ED1

General information

Current stage: 50.20 Proof sent to secretariat or FDIS ballot initiated: 8 weeks Aug 21, 2026

Next stage: PRVD Next stage date : Oct 2, 2026

Originator: IEC

Owner: TC 47/SC 47F

Type: International Standard

ICS: 31.080.99 Other semiconductor devices

Scope

IEC 62047-56 ED1 specifies the requirements and test method for characteristics of MEMS metal oxide semiconductor (MOS) type gas sensor.

Life cycle

NOW

IN_DEVELOPMENT
IEC 62047-56 ED1
50.20 Proof sent to secretariat or FDIS ballot initiated: 8 weeks
Aug 21, 2026

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