0

IEC 62047-54 ED1

Semiconductor devices - Micro-electromechanical devices - Part 54: Silicon based MEMS fabrication technology – Measurement method of tensile strength of microstructures IEC 62047-54 ED1

General information

40.20   DIS ballot initiated: 12 weeks   Jul 31, 2026

PRVC    Oct 23, 2026

IEC

TC 47/SC 47F

International Standard

31.080.99   Other semiconductor devices

Life cycle

NOW

IN_DEVELOPMENT
IEC 62047-54 ED1
40.20 DIS ballot initiated: 12 weeks
Jul 31, 2026




Access Genorma App Everywhere

Get fast and easy access to top European and International standards (EN, ISO, IEC) via your mobile phone, tablet or the web.

Google Play App Store Web Version