IEC 62047-51 ED1

Semiconductor devices - Micro-electromechanical devices - Part 51: Test method of electrical characteristics under two-directional cyclic bending deformation for flexible micro-electromechanical devices

Current stage: 50.00 Final text received or FDIS registered for formal approval Aug 14, 2026

Next stage: CFDIS Next stage date : Nov 6, 2026

Originator: IEC

Type: International Standard

IN_DEVELOPMENT
IEC 62047-51 ED1
50.00 Final text received or FDIS registered for formal approval
Aug 14, 2026