IEC 62047-44:2024 ED1

Name: IEC 62047-44:2024 ED1
Brand: IEC
SKU: IEC 62047-44:2024 ED1
Price: 139.15 EUR
Availability: InStock
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Semiconductor devices - Micro-electromechanical devices - Part 44: Test methods for dynamic performances of MEMS resonant electric-field-sensitive devices

Publication date: Feb 22, 2024

General information

Current stage: 60.60 Standard published Feb 22, 2024

Originator: IEC

Owner: TC 47/SC 47F

Type: International Standard

ICS: 31.080.99 Other semiconductor devices

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Status: Published

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Languages: English

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Scope

IEC 62047-44:2024 describes terminology, definitions and test methods that are used to evaluate and determine the dynamic performance of MEMS (Micro-Electromechanical Systems) resonant electric‑field‑sensitive devices. It also specifies sample requirements and test equipment for dynamic performances of MEMS resonant electric‑field‑sensitive devices. The statements made in this document are also applicable to MEMS resonant electric‑field‑sensitive devices with various driving mechanisms such as electrostatic, electrothermal, electromagnetic, piezoelectric, etc.

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PUBLISHED
IEC 62047-44:2024 ED1
60.60 Standard published
Feb 22, 2024