99.60 Withdrawal effective Dec 12, 2018
WPUB
IEC
International Standard
31.200 Integrated circuits. Microelectronics
Provides general information and definitions on measurement of conducted and radiated electromagnetic disturbances from integrated circuits. Also provides a description of measurement conditions, test equipment and set-up as well as the test procedures and content of the test reports. A test method comparison table is included to assist in selecting the appropriate measurement method(s). Measurement of the voltage and current of conducted RF emissions or radiated RF disturbances, coming from an integrated circuit under controlled conditions, yields information about the potential for RF disturbances in an application of the integrated circuit.
WITHDRAWN
IEC 61967-1:2002 ED1
99.60
Withdrawal effective
Dec 12, 2018
PUBLISHED
IEC 61967-1:2018 ED2