IEC 61967-1:2002 ED1

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions IEC 61967-1:2002 ED1

Publication date:   Mar 12, 2002

General information

99.60 Withdrawal effective   Dec 12, 2018

WPUB   

IEC

TC 47/SC 47A

International Standard

31.200   Integrated circuits. Microelectronics

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Scope

Provides general information and definitions on measurement of conducted and radiated electromagnetic disturbances from integrated circuits. Also provides a description of measurement conditions, test equipment and set-up as well as the test procedures and content of the test reports. A test method comparison table is included to assist in selecting the appropriate measurement method(s). Measurement of the voltage and current of conducted RF emissions or radiated RF disturbances, coming from an integrated circuit under controlled conditions, yields information about the potential for RF disturbances in an application of the integrated circuit.

Life cycle

NOW

WITHDRAWN
IEC 61967-1:2002 ED1
99.60 Withdrawal effective
Dec 12, 2018

REVISED BY

PUBLISHED
IEC 61967-1:2018 ED2