IEC 61788-15:2011 describes measurements of the intrinsic surface impedance (Zs) of HTS films at microwave frequencies by a modified two-resonance mode dielectric resonator method. The object of measurement is to obtain the temperature dependence of the intrinsic Zs at the resonant frequency f0.
PUBLISHED
IEC 61788-15:2011 ED1
60.60
Standard published
Oct 24, 2011
IN_DEVELOPMENT
IEC 61788-15 ED2