IEC 61649:1997 ED1

Goodness-of-fit tests, confidence intervals and lower confidence limits for Weibull distributed data IEC 61649:1997 ED1

Publication date:   May 16, 1997

Scope

Provides numerical methods to complement graphical techniques in performing a goodness-of-fit test for Weibull distributed times to failure and gives an approximate procedure to obtain confidence intervals for the parameters of the two-parameter Weibull distribution when these are estimated by maximum likelihood. Applicable whenever a random sample of items is subjected to a test of times to failure for the purpose of estimating measures of reliability performance of the population from which these items were drawn.