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IEC 61189-5-503:2017 ED1

Test methods for electrical materials, printed board and other interconnection structures and assemblies - Part 5-503: General test method for materials and assemblies - Conductive anodic filaments (CAF) testing of circuit boards IEC 61189-5-503:2017 ED1

Publication date:   May 22, 2017

General information

60.60 Standard published   May 22, 2017

IEC

TC 91

International Standard

31.180   Printed circuits and boards

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Scope

IEC 61189-5-503:2017 specifies the conductive anodic filament (hereafter referred to as CAF) and specifies not only the steady-state temperature and humidity test, but also a temperature-humidity cyclic test and an unsaturated pressurized vapour test (HAST).

Life cycle

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PUBLISHED
IEC 61189-5-503:2017 ED1
60.60 Standard published
May 22, 2017