IEC 61164:1995 ED1

Reliability growth - Statistical test and estimation methods IEC 61164:1995 ED1

Publication date:   Jun 27, 1995

General information

99.60 Withdrawal effective   Mar 24, 2004

IEC

TC 56

International Standard

03.120.01   Quality in general | 03.120.30   Application of statistical methods | 21.020   Characteristics and design of machines, apparatus, equipment

Buying

Revised

Language in which you want to receive the document.

Scope

This standard gives models and numerical methods for reliability growth assessments based on failure data from a single system which were generated in a reliability improvement programme.

Life cycle

NOW

WITHDRAWN
IEC 61164:1995 ED1
99.60 Withdrawal effective
Mar 24, 2004

REVISED BY

PUBLISHED
IEC 61164:2004 ED2