IEC 61163-2:1998 ED1

Reliability stress screening - Part 2: Electronic components

Publication date:   Nov 27, 1998

General information

99.60 Withdrawal effective   Mar 11, 2020

WPUB   

IEC

TC 56

International Standard

03.120.01   Quality in general | 31.020   Electronic components in general

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  Revised

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Scope

Provides guidance on reliability stress screening techniques and procedures for electronic components. Is intended for use of a) component manufacturers as a guideline, b) component users as a guideline to negotiate with component manufacturers on stress screening requirements or plan a stress screening process in house due to reliability requirements, c) subcontractors who provide stress screening as a service.

Life cycle

PREVIOUSLY

WITHDRAWN
IEC 60300-3-7:1999 ED1

NOW

WITHDRAWN
IEC 61163-2:1998 ED1
99.60 Withdrawal effective
Mar 11, 2020

REVISED BY

PUBLISHED
IEC 61163-2:2020 ED2