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IEC 61000-4-17:1999 ED1

Electromagnetic compatibility (EMC) - Part 4-17: Testing and measurement techniques - Ripple on d.c. input power port immunity test IEC 61000-4-17:1999 ED1

Publication date:   Jan 28, 2009

General information

60.60 Standard published   Jun 9, 1999

IEC

TC 77/SC 77A

International Standard

33.100.20   Immunity

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Scope

Defines test methods for immunity to ripple at the d.c. input power port of electrical or electronic equipment. Applies to low-voltage d.c. power ports of equipment supplied by external rectifier systems, or batteries which are being charged. This standard defines - test voltage waveform; - range of test levels; - test generator; - test set-up; - test procedure.

Life cycle

NOW

PUBLISHED
IEC 61000-4-17:1999 ED1
60.60 Standard published
Jun 9, 1999

CORRIGENDA / AMENDMENTS

PUBLISHED
IEC 61000-4-17:1999/AMD1:2001 ED1

PUBLISHED
IEC 61000-4-17:1999/AMD2:2008 ED1