IEC 61000-4-17:1999+AMD1:2001 CSV ED1.1

Electromagnetic compatibility (EMC) - Part 4-17: Testing and measurement techniques - Ripple on d.c. input power port immunity test IEC 61000-4-17:1999+AMD1:2001 CSV ED1.1

Scope

Defines test methods for immunity to ripple at the d.c. input power port of electrical or electronic equipment. Applies to low-voltage d.c. power ports of equipment supplied by external rectifier systems, or batteries which are being charged.

This standard defines

- test voltage waveform;

- range of test levels;

- test generator;

- test set-up;

- test procedure.

This consolidated version consists of the first edition (1999)
and its amendment 1 (2001). Therefore, no need to order amendment in
addition to this publication.