IEC 61000-4-17:1999+AMD1:2001+AMD2:2008 CSV ED1.2

Electromagnetic compatibility (EMC) - Part 4-17: Testing and measurement techniques - Ripple on d.c. input power port immunity test IEC 61000-4-17:1999+AMD1:2001+AMD2:2008 CSV ED1.2

Scope

Defines test methods for immunity to ripple at the d.c. input power port of electrical or electronic equipment. Applies to low-voltage d.c. power ports of equipment supplied by external rectifier systems, or batteries which are being charged. This standard defines
- test voltage waveform;
- range of test levels;
- test generator;
- test set-up;
- test procedure.
This consolidated version consists of the first edition (1999), its amendment 1 (2001) and its amendment 2 (2008). Therefore, no need to order amendments in addition to this publication.