IEC 61000-4-16:1998+AMD1:2001+AMD2:2009 CSV ED1.2

Electromagnetic compatibility (EMC) - Part 4-16: Testing and measurement techniques - Test for immunity to conducted, common mode disturbances in the frequency range 0 Hz to 150 kHz IEC 61000-4-16:1998+AMD1:2001+AMD2:2009 CSV ED1.2

General information

99.60 Withdrawal effective   Dec 9, 2015

IEC

TC 77/SC 77A EMC - Low frequency phenomena

International Standard

33.100.20   Immunity

Scope

IEC 61000-4-16:1998+A1:2001+A2:2009 Establishes a common and reproducible basis for testing electrical and electronic equipment with the application of common mode disturbances to power supply, control, signal and communication ports. This standard defines test voltage and current waveform, range of test levels, test equipment, test set-up and test procedures. The test is intended to demonstrate the immunity of electrical and electronic equipment when subjected to conducted, common mode disturbances such as those originating from power line currents and return leakage currents in the earthing/grounding system.

This consolidated version consists of the first edition (1998),
its amendment 1 (2001) and its amendment 2 (2009). Therefore, no
need to order amendments in addition to this publication.

Life cycle

NOW

WITHDRAWN
IEC 61000-4-16:1998+AMD1:2001+AMD2:2009 CSV ED1.2
99.60 Withdrawal effective
Dec 9, 2015

REVISED BY

PUBLISHED
IEC 61000-4-16:2015 ED2