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IEC 61000-4-11:1994/AMD1:2000 ED1

Amendment 1 - Electromagnetic compatibility (EMC) - Part 4: Testing and measuring techniques - Section 11: Voltage dips, short interruptions and voltage variations immunity tests IEC 61000-4-11:1994/AMD1:2000 ED1

Publication date:   Nov 9, 2000

General information

99.60 Withdrawal effective   Mar 24, 2004

IEC

TC 77/SC 77B

International Standard

33.100.20   Immunity

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Life cycle

PREVIOUSLY

WITHDRAWN
IEC 61000-4-11:1994 ED1

NOW

WITHDRAWN
IEC 61000-4-11:1994/AMD1:2000 ED1
99.60 Withdrawal effective
Mar 24, 2004

REVISED BY

WITHDRAWN
IEC 61000-4-11:2004 ED2