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IEC 60749-43:2017 ED1

Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans IEC 60749-43:2017 ED1

Publication date:   Jun 15, 2017

General information

99.60 Withdrawal effective   Aug 25, 2021

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IEC

TC 47

International Standard

31.080.01   Semiconductor devices in general

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Scope

IEC 60749-43:2017 gives guidelines for reliability qualification plans of semiconductor integrated circuit products (ICs). This document is not intended for military- and space-related applications.

Life cycle

NOW

WITHDRAWN
IEC 60749-43:2017 ED1
99.60 Withdrawal effective
Aug 25, 2021

REVISED BY

PUBLISHED
IEC 63287-1:2021 ED1