IEC 60749-34-1 ED1

Semiconductor devices - Mechanical and climatic test methods - Part 34-1: Power cycling test for power semiconductor module

Current stage: 50.00 Final text received or FDIS registered for formal approval Nov 21, 2024

Next stage: CFDIS Next stage date : Feb 13, 2025

Originator: IEC

Owner: TC 47

Type: International Standard

IN_DEVELOPMENT
IEC 60749-34-1 ED1
50.00 Final text received or FDIS registered for formal approval
Nov 21, 2024