IEC 60749-3:2002/COR1:2003 ED1

Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination

Current stage: 99.60 Withdrawal effective Mar 3, 2017

Next stage: WPUB

Originator: IEC

Owner: TC 47

Type: International Standard

ICS: 31.080.01 Semiconductor devices in general

Modification of the validity date: now put at 2007.

WITHDRAWN
IEC 60749-3:2002/COR1:2003 ED1
99.60 Withdrawal effective
Mar 3, 2017