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IEC 60749-27:2006/AMD1:2012 ED2

Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) IEC 60749-27:2006/AMD1:2012 ED2

Publication date:   Sep 25, 2012

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60.60 Standard published   Sep 25, 2012

IEC

TC 47

International Standard

31.080.01   Semiconductor devices in general

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IEC 60749-27:2006 ED2

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IEC 60749-27:2006/AMD1:2012 ED2
60.60 Standard published
Sep 25, 2012