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IEC 60749-23:2004/AMD1:2011 ED1

IEC 60749-23:2004/AMD1:2011 ED1

Name: IEC 60749-23:2004/AMD1:2011 ED1
Brand: IEC
SKU: IEC 60749-23:2004/AMD1:2011 ED1
Price: 12.1 EUR
Availability: InStock
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Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life

Publication date: Jan 27, 2011

General information

Current stage: 99.60 Withdrawal effective Dec 9, 2025

Originator: IEC

Owner: TC 47

Type: International Standard

ICS: 31.080.01 Semiconductor devices in general

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Status: Revised

PDF - €12.10

Languages: English French Spanish

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PREVIOUSLY

WITHDRAWN
IEC 60749-23:2004 ED1

NOW

WITHDRAWN
IEC 60749-23:2004/AMD1:2011 ED1
99.60 Withdrawal effective
Dec 9, 2025

REVISED BY

PUBLISHED
IEC 60749-23:2025 ED2