IEC 60748-2-20:2000 ED1

Semiconductor devices - Integrated circuits Part 2-20: Digital integrated circuits - Family specification - Low voltage integrated circuits IEC 60748-2-20:2000 ED1

Publication date:   Oct 18, 2000

Scope

The dimensions of integrated circuit devices being continually reduced, to obtain better performance and higher density, the electric fields within the die will increase, which leads to reduced reliability.
This standard aims at giving interface specifications for various sets of values, where each comprises the nominal value of power supply voltage, its tolerances, and the worst-case limit values of the input and output voltages for low voltage integrated circuits.