60.60 Standard published Dec 20, 1990
IEC
International Standard
31.200 Integrated circuits. Microelectronics
Published
Applies to encapsulated semiconductor integrated circuits, including multichip integrated circuits, but excluding hybrid circuits. Gives details of the Quality Assessment Procedures, the inspection requirements, screening sequences, sampling requirements, test and measurement procedures required for the assessment of semiconductor integrated circuits, including digital, analogue and interface circuits.
PUBLISHED
IEC 60748-11:1990 ED1
60.60
Standard published
Dec 20, 1990
PUBLISHED
IEC 60748-11:1990/AMD1:1995 ED1
PUBLISHED
IEC 60748-11:1990/AMD2:1999 ED1