IEC 60747-5-18 ED1

Semiconductor devices - Part 5-18: Optoelectronic devices - Light emitting diodes - Test method of the macro photoluminescence for epitaxial wafers of micro light emitting diodes

Current stage: 30.99 CD approved for registration as DIS Nov 1, 2024

Next stage: TCDV Next stage date : Jan 10, 2025

Originator: IEC

Type: International Standard

ICS: 31.080.99 Other semiconductor devices

IN_DEVELOPMENT
IEC 60747-5-18 ED1
30.99 CD approved for registration as DIS
Nov 1, 2024