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IEC 60747-18-1:2019 ED1

Semiconductor devices - Part 18-1: Semiconductor bio sensors - Test method and data analysis for calibration of lens-free CMOS photonic array sensors IEC 60747-18-1:2019 ED1

Publication date:   May 20, 2019

General information

60.60   Standard published   May 20, 2019

IEC

TC 47/SC 47E

International Standard

31.080.99   Other semiconductor devices

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Scope

IEC 60747-18-1:2019 (E) specifies the test methods and data analysis for the calibration of lens-free CMOS photonic array sensors. This document includes the test conditions of each process, configuration of lens-free CMOS photonic array sensors, statistical analysis of test data, calibration for planarization and linearity, and test reports.

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PUBLISHED
IEC 60747-18-1:2019 ED1
60.60 Standard published
May 20, 2019




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