60.60 Standard published May 20, 2019
IEC
International Standard
31.080.99 Other semiconductor devices
Published
IEC 60747-18-1:2019 (E) specifies the test methods and data analysis for the calibration of lens-free CMOS photonic array sensors. This document includes the test conditions of each process, configuration of lens-free CMOS photonic array sensors, statistical analysis of test data, calibration for planarization and linearity, and test reports.
PUBLISHED
IEC 60747-18-1:2019 ED1
60.60
Standard published
May 20, 2019