Menu

0

IEC 60747-14-13 ED1

Semiconductor devices - Part 14-13: Semiconductor sensors - Performance test methods for spectral sensors

General information

30.60   Close of voting/ comment period   Jul 31, 2026

IEC

TC 47/SC 47E

International Standard

31.080.01   Semiconductor devices in general

Life cycle

NOW

IN_DEVELOPMENT
IEC 60747-14-13 ED1
30.60 Close of voting/ comment period
Jul 31, 2026