IEC 60747-14-13 ED1

Semiconductor devices - Part 14-13: Semiconductor sensors - Performance test methods for spectral sensors IEC 60747-14-13 ED1

Current stage: 30.60 Close of voting/ comment period Jul 31, 2026

Originator: IEC

Type: International Standard

ICS: 31.080.01 Semiconductor devices in general

IN_DEVELOPMENT
IEC 60747-14-13 ED1
30.60 Close of voting/ comment period
Jul 31, 2026

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