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IEC 60747-14-12:2026 ED1

Semiconductor devices - Part 14-12: Semiconductor sensors - Performance test methods for CMOS imager-based gas sensors IEC 60747-14-12:2026 ED1

Publication date:   Nov 4, 2026

General information

60.60   Standard published   Nov 4, 2026

IEC

TC 47/SC 47E

International Standard

31.080.01   Semiconductor devices in general

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Scope

IEC 60747-14-12:2026 specifies the performance test methods for CMOS imager-based gas sensors. It includes the terms and definitions, the test environmental conditions, the test system, the test methods, and the test report. This document is applicable to the performance test of both CMOS gas sensors based on lens-free imaging and CMOS gas sensors based on lens imaging.

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PUBLISHED
IEC 60747-14-12:2026 ED1
60.60 Standard published
Nov 4, 2026




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