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IEC 60747-10:1991 ED2

Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits IEC 60747-10:1991 ED2

Publication date:   May 21, 1991

95.99   Withdrawal of Standard   Jul 31, 2015

General information

95.99   Withdrawal of Standard   Jul 31, 2015

IEC

TC 47/SC 47E

International Standard

31.080.01   Semiconductor devices in general | 31.200   Integrated circuits. Microelectronics

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Scope

It is a generic specification for semiconductor devices, discrete
devices and integrated circuits, including multichip integrated
circuits, but excluding hybrid circuits.
It defines general procedures for quality assessment to be used in
the IECQ System and gives general rules for measuring methods of
electrical characteristics, climatic and mechanical tests, and
endurance tests.

Life cycle

PREVIOUSLY

WITHDRAWN
IEC 60747-10:1984 ED1

NOW

WITHDRAWN
IEC 60747-10:1991 ED2
95.99 Withdrawal of Standard
Jul 31, 2015

CORRIGENDA / AMENDMENTS

WITHDRAWN
IEC 60747-10:1991/AMD1:1995 ED2

WITHDRAWN
IEC 60747-10:1991/AMD2:1996 ED2

WITHDRAWN
IEC 60747-10:1991/AMD3:1996 ED2




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