IEC 60512-26-100:2008 ED1

Connectors for electronic equipment - Tests and measurements - Part 26-100: Measurement setup, test and reference arrangements and measurements for connectors according to IEC 60603-7 - Tests 26a to 26g IEC 60512-26-100:2008 ED1

Publication date:   Jul 21, 2008

General information

60.60 Standard published   Jul 21, 2008

IEC

TC 48/SC 48B

International Standard

31.220.10   Plug-and-socket devices. Connectors

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Scope

IEC 60512-26-100:2008 specifies the test and measurements and the related measurement setup and reference arrangements for interoperability and backward compatibility tests for the development and qualification of 8-way, free and fixed connectors for data transmission. The following test methods are provided:
- insertion loss, test 26a;
- return loss, test 26b;
- near-end crosstalk (NEXT), test 26c;
- far-end crosstalk (FEXT), test 26d;
- transfer impedance, test 26e;
- transverse conversion loss (TCL), test 26f;
- transverse conversion transfer loss (TCTL), test 26g.
This publication is to be read in conjunction with IEC 60512-1:2001 and IEC 60512-1-100:2006.

Life cycle

NOW

PUBLISHED
IEC 60512-26-100:2008 ED1
60.60 Standard published
Jul 21, 2008

CORRIGENDA / AMENDMENTS

PUBLISHED
IEC 60512-26-100:2008/AMD1:2011 ED1