Published
Deals with basic measurements which are equally applicable to a sub-system such as an amplifier, or to a combination of sub-systems assembled to simulate a satellite earth station.
Methods of measurements are described for the following parameters:
-input and output impedance (return loss);
-input and output levels;
-baseband gain or loss;
-amplitude/frequency characteristic;
-group-delay/frequency characteristic;
-non-linear amplitude distortion;
-differential gain and phase distortion.
PUBLISHED
IEC 60510-1-4:1986 ED1
60.60
Standard published
Jan 1, 1986