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IEC 60444-2:1980 ED1

Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units IEC 60444-2:1980 ED1

Publication date:   Jan 1, 1980

General information

60.60 Standard published   Jan 1, 1980

IEC

TC 49

International Standard

31.140   Piezoelectric devices

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Scope

Describes a method of measuring the motional capacitance of quartz crystal units in the frequency range 1 MHz to 125 MHz with a total measurement error of the order of 5%.

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PUBLISHED
IEC 60444-2:1980 ED1
60.60 Standard published
Jan 1, 1980