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IEC 60191-6-16:2007 ED1

Mechanical standardization of semiconductor devices - Part 6-16: Glossary of semiconductor tests and burn-in sockets for BGA, LGA, FBGA and FLGA

Publication date:   Apr 26, 2007

General information

60.60 Standard published   Apr 26, 2007

IEC

TC 47/SC 47D

International Standard

31.080.01   Semiconductor devices in general

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Scope

IEC 60191-6-16:2007 gives a glossary of semiconductor sockets for BGA, LGA, FBGA and FLGA. This standard intends to establish definitions and unification of terminology relating to tests and burn-in sockets for BGA, LGA, FBGA and FLGA.

Life cycle

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PUBLISHED
IEC 60191-6-16:2007 ED1
60.60 Standard published
Apr 26, 2007

REVISED BY

ABANDON
IEC 60191-6-16 ED2