IEC 60147-4:1976 ED1

Name: IEC 60147-4:1976 ED1
Brand: IEC
SKU: IEC 60147-4:1976 ED1
Price: 139.15 EUR
Availability: InStock
Rating: 5 (72 reviews)

Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 4: Acceptance and reliability

Publication date: Jan 1, 1976

95.99 Withdrawal of Standard Mar 31, 1995

General information

Current stage: 95.99 Withdrawal of Standard Mar 31, 1995

Originator: IEC

Owner: TC 47

Type: International Standard

ICS: 31.080.10 Diodes

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Status: Withdrawn

PDF - €139.15

Languages: English French Russian

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Scope

Gives conditions for electrical tests, for different temperature conditions and for different durations, as well as failure-defining characteristics and failure criteria, which are standardized for each device category. This permits a unique and easy comparison of data presented by different manufacturers, relative to acceptance testing as well as to reliability testing.
Deals with semiconductor devices and digital integrated circuits (bipolar, MOS, multi-chip and hybrid circuits).

Life cycle

NOW

WITHDRAWN
IEC 60147-4:1976 ED1
95.99 Withdrawal of Standard
Mar 31, 1995

REVISED BY

ABANDON
IEC 60147-4 ED2