IEC 60147-4:1976 ED1

Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 4: Acceptance and reliability IEC 60147-4:1976 ED1

Publication date:   Jan 1, 1976

95.99 Withdrawal of Standard   Mar 31, 1995

General information

95.99 Withdrawal of Standard   Mar 31, 1995

IEC

TC 47

International Standard

31.080.10   Diodes

Buying

Withdrawn

Language in which you want to receive the document.

Scope

Gives conditions for electrical tests, for different temperature conditions and for different durations, as well as failure-defining characteristics and failure criteria, which are standardized for each device category. This permits a unique and easy comparison of data presented by different manufacturers, relative to acceptance testing as well as to reliability testing.
Deals with semiconductor devices and digital integrated circuits (bipolar, MOS, multi-chip and hybrid circuits).

Life cycle

NOW

WITHDRAWN
IEC 60147-4:1976 ED1
95.99 Withdrawal of Standard
Mar 31, 1995

REVISED BY

ABANDON
IEC 60147-4 ED2