IEC 60147-2M:1980 ED1

Supplement M - Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 2: General principles of measuring methods

Publication date:   Jan 1, 1980

95.99   Withdrawal of Standard   Mar 31, 1995

General information

95.99   Withdrawal of Standard   Mar 31, 1995

IEC

TC 47

International Standard

31.080.10   Diodes

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Scope

Deals with measuring methods for signal and voltageregulator diodes, bipolar and field-effect transistors. Some methods, formerly described, are brought up to date according to more modern techniques or equipment; some others are newly described.

Life cycle

NOW

WITHDRAWN
IEC 60147-2M:1980 ED1
95.99 Withdrawal of Standard
Mar 31, 1995

REVISED BY

ABANDON
IEC 60147-2M ED2