0

IEC 60147-2M:1980 ED1

Supplement M - Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 2: General principles of measuring methods IEC 60147-2M:1980 ED1

Publication date:   Jan 1, 1980

95.99   Withdrawal of Standard   Mar 31, 1995

General information

95.99   Withdrawal of Standard   Mar 31, 1995

IEC

TC 47

International Standard

31.080.10   Diodes

Buying

Withdrawn

Language in which you want to receive the document.

Scope

Deals with measuring methods for signal and voltageregulator diodes, bipolar and field-effect transistors. Some methods, formerly described, are brought up to date according to more modern techniques or equipment; some others are newly described.

Life cycle

NOW

WITHDRAWN
IEC 60147-2M:1980 ED1
95.99 Withdrawal of Standard
Mar 31, 1995

REVISED BY

ABANDON
IEC 60147-2M ED2




Access Genorma App Everywhere

Get fast and easy access to top European and International standards (EN, ISO, IEC) via your mobile phone, tablet or the web.

Google Play App Store Web Version